Used NIKON Optistation III #293629208 for sale

ID: 293629208
Vintage: 1995
Microscope 1995 vintage.
NIKON Optistation III is a highly sophisticated mask and wafer inspection equipment. The system allows for the inspection of masks, photomasks, wafers and other related objects. It is designed to provide high-precision inspection of components, with an optimal balance of speed, accuracy, resolution and flexibility. The unit is composed of five primary components: an inspection stage, a high-resolution digital camera, an image acquisition control unit, an image inspector software suite and a monitor. The first component, the inspection stage, utilizes a series of x-y linear motion stages and indexers for synchronous movement of the sample. This allows for precise image alignment, making sure that any defects on the sample can be identified accurately. The second component, the high-resolution digital camera, is capable of providing magnifications up to 300X. This high-resolution camera is connected to an image acquisition control unit, which is responsible for the automatic capturing and controlling of images. These images are then organized into an image database and stored in a server. The third component, the image inspector software suite, is the main tool used for user interface and image inspection. This software suite is capable of displaying images at different magnifications and contrast levels, as well as allowing for contrast adjustment, zoom and panning. This software is also able to identify and classify defects based on predefined criteria. The fourth component, the monitor, is used for displaying the images acquired by the machine. Its purpose is to verify the images inspected on the monitor and to compare them to the original specimens. Multiple monitor size and resolution options are available, allowing for flexibility. Finally, the software suite is able to export images in a variety of file formats, allowing for the easy transfer of image data. NIKON OPTISTATION-III is an efficient and reliable option for mask and wafer inspection, providing a user-friendly interface, precision accuracy and versatile application possibilities.
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