Used NIKON Optistation III #293629231 for sale

NIKON Optistation III is a piece of high-end mask and wafer inspection equipment designed for use in the semiconductor industry. It provides a comprehensive suite of measurement and analysis capabilities for mask and wafer inspection and is capable of operating at up to 250 wafers per hour. It features a fully automated equipment including a high-speed scanner, image processor, image analyzer, and a high-precision metrology station. This system provides a complete process control unit including a high-accuracy overlay and wafer measurement machine, fully automated defect analysis, and reporting systems. NIKON OPTISTATION-III is based on an advanced optical imaging tool featuring a high-resolution CCD sensor and zoom lens asset. The CCD sensor is capable of capturing microscopic images of a mask or wafer in less than one second. The zoom lens model allows for accurate analysis of features as small as 5 μm, thus enabling the detection of very small defects. Optistation III also includes software that allows for the automatic analysis and classification of mask and wafer images. OPTISTATION-III also provides a high-accuracy overlay and wafer measurement equipment. This system can accurately measure patterns on the mask and wafer after inspection, enabling the detection of any position and size changes that may occur. In addition, the unit is equipped with advanced metrology software which provides accurate 3D analysis of the measured patterns. The software also provides a comprehensive set of reporting tools to analyze and compare inspection results. NIKON Optistation III also provides an automated defect analysis function. This function automatically inspects masks and wafers for various types of defects and can then provide detailed information about them. The machine also includes a variety of manual analysis functions, including manual measurements, manual defect classification and critical defect review. In conclusion, NIKON OPTISTATION-III provides a comprehensive suite of capabilities for users in the semiconductor industry. It enables fast and accurate inspection of masks and wafers, with detailed analysis and reporting. The tool also includes a high-accuracy overlay and wafer measurement asset, automated defect analysis, and manual analysis functions. All these features help ensure high-quality inspection and make Optistation III an ideal choice for mask and wafer inspection.