Used NIKON Optistation III #293761049 for sale

NIKON Optistation III is an advanced mask and wafer inspection system designed for semiconductor manufacturers. It offers high-level wafer inspection from the reticle to the packaged die, enabling fast, accurate, and precise inspection of device parameters and their patterns. It features a fully automated, highly efficient, and cost-effective process for detecting, measuring, and verifying the quality and performance of integrated circuits. NIKON OPTISTATION-III features an advanced detection system that enables it to detect very small defects which could otherwise go unnoticed during manual or automated inspections. It utilizes a number of proprietary technologies such as unique optical polarizing algorithms, bright-field and dark-field digital imaging, and a proprietary image processing algorithm. These technologies allow for precise and simultaneous measurement of multiple layers of device structures as well as accurate and rapid pattern recognition. Moreover, the device also provides measurements of reliability parameters such as the yield rate, defect density, and the fraction of dead die on the wafer. At the core of Optistation III is a state-of-the-art high-power laser which provides over 500 mJ/cm2 illumination of the sample. This illumination is exceptionally uniform and optimized for optimal device inspection. The illumination also reduces scatter radiation while allowing the operator to adjust the power depending on what kind of defect is being inspected. OPTISTATION-III is highly reliable, fast, and accurate. It offers a wide range of parameters for metrology and non-destructive testing. The device is designed to be user-friendly as well, with intuitive user interface and easy to understand menus. It also provides rapid data analysis and custom report generation. Overall, NIKON Optistation III offers industry leading mask and wafer inspection capabilities. It offers a high throughput and accuracy, with optimized illumination and intelligent algorithms to provide very reliable results. It is ideal for semiconductor manufacturers who require very fast and accurate inspections.