Used NIKON Optistation VII #293644210 for sale

NIKON Optistation VII is a mask and wafer inspection equipment that combines the speed, accuracy and reliability of the leading edge of digital imaging. It is designed to deliver excellent performance in the most demanding process flow and applications for wafer and mask inspection. Optistation VII is equipped with a 4K or 8K digital imaging system, allowing for high resolution and excellent accuracy for wafer and mask inspections. The unit utilizes advanced optics, with a high numerical aperture to enable image capture from a 1µm to 10mm field of view with subpixel level accuracy. The machine also integrates with the optical systems and provides industry leading signal to noise and signal to noise ratio performance. NIKON Optistation VII utilizes the latest signal processing technology to deliver a high degree of repeatability and robustness in order to meet all present and future industry demands. Optistation VII is designed with a high speed double sensing solution to achieve a high throughput and low inspection times. Its advanced automatic control features provide automated operation and process integration. Moreover, the tool features an intuitive graphical user interface to simplify operation. NIKON Optistation VII also incorporates an array of different algorithms as well as an enhanced inspection library, covering various levels of defect detection, including particle counts, edge inspections, quality assurance, and other parameters. Furthermore, the asset is equipped with advanced automated defect recognition and markout capabilities to support simple, high-quality defect classification. In addition to inspection capabilities, Optistation VII is also capable of IRD defect mapping, proving the capability to provide a map of defects from a single image. This allows for highly sensitive analysis of defects, enabling quick and accurate analysis and characterization. NIKON Optistation VII also integrates tightly with defect processing systems for automated reticle and wafer comparison and defect classification. With its powerful imaging capability, high quality inspection results, and smooth integration within the overall process flow, Optistation VII is an invaluable tool in the world of wafer and mask inspection.