Used NIKON Optistation VII #293645159 for sale

NIKON Optistation VII
ID: 293645159
Automatic wafer pattern inspector.
NIKON Optistation VII is an advanced mask and wafer inspection equipment designed to meet the demands of high-volume manufacturing. The system employs two high-resolution detectors to offer simultaneous wafer and mask inspection in a single device. It supports optical defect inspection on various layers of the wafer including front-side, back-side, and overlay, as well as mask defects. Its advanced Photon Counting Detector technology allows for superior resolution, enabling it to detect small defects and generate defect-free masks. Optistation VII deploys four different optical systems for any given inspection task, including brightfield, phase aberration detector (PAD), phase shift defect (PSD), and phase shift camera (PSC) modes. The brightfield unit uses transmitted visible light to allow operators to quickly and accurately identify and analyze defects. The PAD machine utilizes a near-field optical microscope to detect phase development, allowing physicians to pinpoint and correct phase abnormalities. The PSD tool uses confined photon control to precisely measure phase shifts during inspections, while the PSC asset collects phase data and assigns it to objects or surface area measurements. In addition, the model offers several advanced inspection technologies that are specifically tailored for mask patterns and wafer fabrication. The Autofocus (AF) feature automatically adjusts the microscope objective lens settings to ensure the highest possible image quality. The Hybrid Pulse Phase technology further assists AF optical focus, while the Perpendicularity Correction technology ensures that edges are very accurately perpendicular independent of focus settings. The Splitting Focus technology offers sharper images by allowing points in the field of view to be focused differently. NIKON Optistation VII is a highly versatile equipment that can scale up to a full production environment with a script management system that automates inspection tasks and ensures high throughput. It is also equipped with an ergonomic S-VGA monitor to display real-time inspection results and an intuitive GUI to facilitate easy operation. Furthermore, the unit features a dual image viewing mode which overlays an image taken from both detectors to make inspections easier. Optistation VII is a reliable and powerful mask and wafer inspection machine that offers great flexibility and a range of advanced technologies. It is an excellent choice for high-volume manufacturing, as its robust design and versatile features ensure accurate and reliable results for any given inspection task.
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