Used NIKON Optistation VII #293652979 for sale

ID: 293652979
Wafer inspection system.
NIKON Optistation VII is a high-end mask & wafer inspection equipment designed to provide automated testing and defect analysis of photomasks and wafers. This system is suitable for both manufacturing and research and development applications, making it an ideal choice for semiconductor, flat panel display, and microelectronic manufacturers. Optistation VII utilizes NIKON proprietary Darkfield Optical Technology along with a dual-light teaching method to analyze complicated patterns of wafers and photomasks. This unit features a fully automated light intensity adjustment and focus control that allows for accurate measurements and defect analysis. The optics used have a large depth of field, allowing for clear imaging of 3-dimensional features. The Optistation 7 also features advanced imaging capabilities, such as brightfield, darkfield, color imaging, and side-view auto-focus. The Optistation 7 is a multi-functional machine with a wide range of features and options including 3D image acquisition, image archiving, and comprehensive reporting capabilities. The tool also features several advanced imaging capabilities, such as include seam-on-flat, chamfer measurement, double-sided wafer line of sight inspection, and co-ordinate measurement. NIKON Optistation VII also utilizes a precision measurement asset that allows for accurate alignment and positioning of the photomask and wafer. This model is also outfitted with a dedicated auto-focus and light intensity adjustment, allowing for high-precision spot and line scan of the mask or wafer's surface. Additionally, Optistation VII can be outfitted with a variety of peripherals, such as a vision console, microscope, a motorized CCD, and a digital remote control. In summary, NIKON Optistation VII is a versatile and powerful imaging and testing equipment for photomasks and wafers. It features a wide range of features and options and utilizes NIKON propriety Darkfield Optical Technology to accurately and rapidly detect defects and measure precise features of a wafer or photomask. Additionally, Optistation VII offers specific features such as seam-on-flat, chamfer measurement, double-sided wafer line of sight inspection and co-ordinate measurement. NIKON Optistation VII is an ideal choice for semiconductor, flat panel display and microelectronic manufacturers.
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