Used NIKON Optistation VII #293654952 for sale

NIKON Optistation VII is a high-end mask and wafer inspection equipment with outstanding resolution, image quality, and throughput. The system is equipped with an 8-megapixel imaging sensor, allowing for the capturing of high-resolution images with a wide dynamic range. Combined with NIKON advanced image-processing technology, this enables Optistation VII to accurately identify and inspect even small defects. NIKON Optistation VII offers both semi-automatic and fully-automated operation. The integrated imaging unit features a self-calibration machine, allowing the machine to quickly and accurately align the inspection pattern to the wafer. Additionally, the state-of-the-art dual-zone illumination tool ensures that accurate and reliable inspection can be conducted over both transparent and opaque structures. In terms of accuracy and precision, Optistation VII offers a maximum lateral resolution of 0.8 μm, with a high degree of uniformity and repeatability. Meanwhile, the asset's intelligent auto-exposure feature dynamically adjusts the exposure settings for each individual wafer, allowing for a greater level of accuracy and reliability in complex inspection measurements. Furthermore, NIKON Optistation VII includes a range of field-proven, integrated optical and software solutions, allowing the model to fulfill a large variety of inspection tasks. Optistation VII also comes equipped with powerful data management capabilities. It allows users to easily store and access their inspection data, with support for common file formats such as TIFF and JPEG. The equipment can also be connected to existing infrastructure through an Ethernet or USB connection, enabling remote debugging and system diagnostics. The built-in supervisor software also enables user data to be managed and tracked centrally. NIKON Optistation VII is a robust and reliable inspection unit, capable of accurately detecting and locating defects in both wafer and mask surfaces. It offers outstanding resolution, image quality, and throughput, as well as a range of advanced functions and powerful data management capabilities, making it an ideal choice for mask and wafer inspection.