Used OLYMPUS KIF-10W #9395780 for sale

OLYMPUS KIF-10W is an advanced mask & wafer inspection equipment that is capable of providing high accuracy image capture and analysis. It is a versatile inspection system suitable for both laboratory and industrial settings. The unit is designed to analyze and measure mask and wafer features quickly and accurately by combining full brightfield imaging and digital image capture. The machine features a high power Kohler illumination tool and a 4 Megapixel sensor that offer highly accurate and fast imaging capabilities. KIF-10W asset is designed to accurately measure features of a mask or wafer such as line widths, critical dimensions, and surface topography. It is capable of capturing images up to 64 megapixels and can detect the most subtle defects with a high level of accuracy. The high power model is well equipped to handle multiple sample sizes with a wide field of view and high resolution images. It also features a high speed pattern projector and dynamic image enhancement, ensuring excellent image quality for complex samples. OLYMPUS KIF-10W features an intuitive software interface, allowing users to quickly and easily access and control all image capture and analysis settings. For wafer analysis, the equipment offers a comprehensive suite of imaging and analysis tools, such as 3D mapping, edge detection, thin metal line profiling, and edge deviation measurements. It also allows users to focus on specific areas and to carry out manual zooming and panning. In addition, KIF-10W includes an automated search for defects with a built-in library of defect learning algorithms. This enables users to quickly classify and characterize defects with a digital imaging filter which is capable of finding and recording the most complex defects. Furthermore, the system provides automatic defect classification with a real-time report generation feature, allowing users to quickly and easily get a full understanding of their sample's condition. Overall, OLYMPUS KIF-10W is an advanced, high-performance mask and wafer inspection unit that is designed for fast, accurate, and reliable inspection and analysis of chips and circuits. Its high resolution imaging capabilities combined with its intuitive controls make it an ideal option for both laboratory and industrial settings.