Used OSI Microvision 500 #293640266 for sale

OSI Microvision 500 is an advanced mask and wafer inspection equipment designed for viewing wafers in the semiconductor industry. This system uses non-destructive digital imaging technology to identify defects in masks and wafers, providing accurate picture-in-picture analysis of images with resolution as small as 1 micron. The unit features a highly efficient, high-accuracy bright field optics machine which enables it to detect faults on all layers of the wafer, even in extreme substrate thicknesses. It also offers a wide range of imaging modes including magnified inspection, photomicrography, and laser beam scanning, to facilitate highly accurate analysis of irregular and sophisticated structure elements. Microvision 500 has a compact, modular design and requires minimal floor space. It features an ergonomically designed inspection room which offers optimum visibility and comfort to the operator, while the tool also provides a high level of protection against harmful radiation. The asset offers powerful software which is capable of automatically acquiring, analyzing, and displaying results from all inspection stages. In addition, the model is capable of delivering outstanding performance even in low-light areas due to its low-reflection optical filters. The equipment also has a highly sensitive optical and electronic detection system, capable of detecting inaccuracies in minimal defects as small as 2 microns, making it one of the most accurate mask and wafer inspection systems in the market. OSI Microvision 500 is equipped with a powerful communication interface which supports a range of connectivity options, thereby enabling easy integration with the user's environment. This unit is also equipped with a variety of accessories such as image capture lenses, integration of other inspection modes, and can be used with a range of other software such as full defect analysis, die-to-wafer alignment, process control, and so on. Microvision 500 is an ideal solution for mask and wafer inspection, enabling users to identify faults at an early stage of the production cycle and avoid costly rework later. It is highly reliable, efficient, and cost-effective, making it a must-have inspection machine for all types of semiconductor fabrication.