Used PARLEC P2500A-0387 #9266042 for sale

PARLEC P2500A-0387 mask & wafer inspection equipment is a high-precision device used to check the condition of dies, wafers, circuit boards, and other materials used in the manufacture of integrated circuits (ICs). It offers a high-resolution inspection with an image size of 20 microns, and is capable of detecting defects as small as 0.5 microns. It is designed with an advanced imaging system that combines the use of binocular and non-contact optical microscopy with triangulation-based 3D reconstruction. This allows it to capture detailed images of the entire surface area of a wafer or circuit board, and is capable of detecting flaws as small as 0.5 microns. The unit features two modes: manual and automatic. In the manual mode, a manual joystick allows users to manually adjust both the x-y position of the device, and the focus. In the automatic mode, a "target lock" feature ensures that the device will stay centered on the relevant image even when moving the position of the device. Additionally, the machine has software-based feature recognition which allows it to detect patterns, edges, and corners on the material being inspected. P2500A-0387 is designed to be easy to use and operate. Its integrated image storage allows users to browse, store, and review inspected images directly from the control panel. Furthermore, built-in Ethernet technology enables the device to be connected to a network for remote control, and analysis of data. PARLEC P2500A-0387 mask & wafer inspection tool offers a robust platform and performance for inspecting ICs. Its high-resolution imaging, precise optics, high accuracy, and intuitive interface make it an ideal choice for die, wafer, and circuit board inspection. By providing users with the ability to easily and quickly detect flaws in these materials, the asset is helping to improve the quality and reliability of ICs at a significantly lower cost.