Used PRISM VIS-168 #293587201 for sale

PRISM VIS-168 is a mask and wafer inspection equipment used to examine mask defects and non-uniformly printed solder masks or conductive pastes. The system features two magnifications (1x and 8x) for inspecting large-scale and small-scale defects, which are scanned at high resolution for maximum detail. The open-architecture design of the unit's user interface allows for easy operation even with complex data processing of hard-to-inspect samples. VIS-168 features a high-speed scanning machine for fast sample detection and analysis. A 6-megapixel, high-gain color imaging sensor provides greater detail. Additionally, a 4K video frame rate ensures smooth and quick scanning of images. Automated edge detections make it easy to identify locations of issues on a mask. The tool's intuitive software helps users to quickly detect, inspect, and analyze defects. Fundamentals such as image size, brightness, and contrast can be adjusted on the fly. Pre-programmed mask parameters such as size, thickness, pattern distribution, and device locations can be stored and recalled. By using an easy-to-learn software interface, users can take advantage of comprehensive statistical analysis. Statistics such as minimum spot size, size distribution, and length can be accessed for improved analysis of mask defects. An included defect analysis and review suite helps to quickly review defects, prioritize them, and make corrective action decisions. PRISM VIS-168 is available in various configurations from basic to fully loaded. All models are upgradeable and scalable, providing solutions for a range of mask and wafer inspection applications. In addition to its ease of operation, the asset's USB and optional Ethernet connectivity provide convenient data transfer for off-site consultation. VIS-168 is ideal for finding small defects and making accurate measurements in hard-to-inspect samples. With its powerful set of features and intuitive software, the model provides users with reliable results and improved process control.