Used PRISM VIT-128 #293587206 for sale

PRISM VIT-128 is a mask & wafer inspection equipment specially designed for the semiconductor industry. It is a vision-based automated inspection system that utilizes machine vision technology to detect wafer defects and other irregularities at the microscopic level. The unit is composed of an ultra-high-resolution telecentric lens and an integrated imaging & vision processor. The lens enables the capture of high-density images of the wafer under inspection. The imaging & vision processor then utilizes the latest algorithms and architectures to perform the inspection. It can quickly and accurately detect surface defects, including scratches, chipped edges, broken facets, localized contamination, cracks, pits, holes and other visual discontinuities. The machine is capable of detecting anomalies with high accuracy up to a resolution of 1um. VIT-128 tool has an intuitive user interface that allows easy set-up of the parameters and easy control of the whole inspection process. It has several imaging mode such as monolith, droplet and rotary,that enable the capturing of multiple images of the inspected object. The asset is also equipped with real-time condition monitoring that detects any out-of-spec abnormalities and notify it immediately at the inspection station. The model also has 3D imaging capabilities that provide insight into the physical and geometrical characteristics of the inspected object. It is capable of accurately measuring height and width as well as performing texture analyses at the subpixel level. It also includes advanced image processing algorithms that enable the analysis of complex surface features, such as individual particles and other contaminations. In addition to its advanced features, PRISM VIT-128 inspection equipment is incredibly easy to use and maintain with its advanced self-diagnostic and maintenance functions. It is also designed for expandability to meet the needs of future applications. This advanced inspection system enables quick, accurate and reliable detection of various kinds of defects and irregularities on wafer and masks at the microscopic level.