Used PRISM VIT-148 #293587202 for sale

ID: 293587202
Vintage: 2011
Semi auto visual inspection system CPU Power supply has been removed 2011 vintage.
PRISM VIT-148 is a state-of-the-art inspection equipment for masks and wafers. It is designed to detect and classify defects at the wafer and mask level with high accuracy and speed. The system uses both optical and electrical techniques to detect and classify defects. The optical unit utilizes two high-resolution cameras for optimal image quality and defect detection. A bright light source is used to provide a uniform and reliable illumination environment. This machine also employs advanced image processing techniques to enhance detectability, including digital image filtering and defect characterization. The electrical tool of VIT-148 offers high-resolution electronics imaging to allow measurement of electrical characteristics of wafer patterns, such as the width and height of the pattern features. This improves the detection and classification of defects, particularly those relating to features such as corrosion or bridging. Voltage contrast imaging (VCI) is also employed to ensure high sensitivity when considering electrical parameters. The mask and wafer inspection asset has also been designed with a versatile hardware interface. This allows for easy connection of various specialized tools, such as laser microscopes for real-time imaging, or spectroscopes for chemical analysis of suspicious areas. Furthermore, the smart interconnected components make it possible to quickly spot and analyze various defect types, even in highly complex layouts. PRISM VIT-148 includes powerful control and analysis software, featuring automated defect detection and pattern recognition capabilities. This software provides inspection reports, detailed logs and analytical data for further analysis. The integrated software can generate graphic display of the defect distribution maps and yield analysis, enabling comprehensive and thorough product analysis. Overall, VIT-148 is a complete, reliable and efficient inspection model that allows precision examination of masks and wafers to find even the most elusive defects. With its high-resolution imaging, versatile hardware interface and specialized analysis capabilities, it can ensure that every product meets the highest industry standards.
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