Used PROBING SOLUTIONS WM42 #140675 for sale

PROBING SOLUTIONS WM42 mask & wafer inspection equipment is a high-performance, high-speed imaging and analysis system for integrated circuit (IC) inspection. It is designed for production lines and is used for the most demanding and complex ICs, such as FinFET, 3D and High Voltage (HV). It offers powerful inspection capabilities for both non-contact optical and contact electrical measurements. The WC42 unit utilizes a series of specifically designed probes that have a microscopic field of view. The probes are connected to an imaging machine that has a high-resolution, high zoom lens to capture images of the ICs. An imaging head containing the probes is mounted to a precision linear stage, allowing the head to be directed accurately to any region of the IC. The probes are precisely calibrated to be able to identify defects within the circuitry of the IC by measuring minimally altered electrical behavior of the circuits. The probes can be used in combination with optical and laser techniques to perform a complete physical and electrical analysis of microstructures. The advanced analysis systems of WM42 includes several advanced image processing algorithms and software tools, which allow for a detailed examination and analysis of the images obtained by the inspection. This data can then be used to identify defects and output detailed reports. PROBING SOLUTIONS WM42 tool also offers advanced power measurements, which allow for the identification of short and open circuit defects in the IC circuitry. Power measurements to identify voltage and current drop across the IC's logic cells, which helps pinpoint weaknesses in the electrical circuits. WM42 asset also provides advanced thermal, vibration and motion control to enable precise movement of the probe head to any point on the IC. The model also has a number of options for the customer, such as accessing 3D view of the IC, edge enhanced imaging, multi-channel analysis, and feed-thru testing. PROBING SOLUTIONS WM42 equipment is an invaluable tool for ICs, providing advanced probing and analysis capabilities to identify defects and improve product yields. It enables faster and more accurate IC monitoring and production control, ensuring that customers get the product they expect.