Used RAYTEX RXW-1226SFI #9315831 for sale

RAYTEX RXW-1226SFI is a mask & wafer inspection equipment specifically designed for use in semiconductor process environments. This system is equipped with an integrated Optical Inspection Unit (OIS) which utilizes bright-field and dark-field image optimization, as well as structured infrared technology to detect a wide range of defects. Additionally, its advanced signal processing machine is capable of automatically evaluating defects, in order to classify them according to their severity. RAYTEX RXW 1226SFI has an exceptionally high resolution of 10 micrometers. This makes it a highly accurate tool for the inspection of masks and other photo-resistive surfaces. The integrated light source in the tool further ensures that the highest possible lighting conditions are provided for defect inspection and identification, aiding in a faster and higher quality analysis. The asset also features multiple coverage methods, including strip and full-coverage modes. These provide flexibility in terms of the types of inspections and analysis that can be conducted. Additionally, the model also provides various pattern recognition algorithms that enable it to provide an automated analysis of defect patterns. The equipment also features a touch screen interface which provides an intuitive and easy to use interface to the user. This allows for easy navigation of the system and can be used to control various settings. The unit also features a variety of customization options, allowing for tailored data output for different types of inspections. Overall, RXW-1226SFI is an excellent and highly advanced mask and wafer inspection machine. Its advanced Optical Inspection Tool is capable of detecting a wide range of defects and its customizable output provides increased precision and accuracy in the analysis and detection of these defects. This asset is an exceptionally powerful tool and is essential in the semiconductor process environment.