Used RAYTEX RXW-1227 EdgeScan #9397347 for sale

RAYTEX RXW-1227 EdgeScan
ID: 9397347
Edge defect inspection system.
RAYTEX RXW-1227 EdgeScan is a leading-edge mask and wafer inspection equipment for the semiconductor industry. It provides high-resolution imaging of wafer edges, maximizing image clarity and capturing small defects across the entire wafer surface. The EdgeScan system is built with a high-accuracy indexing mechanism and ergonomic automation, allowing for precise control and fast setup times. The unit's fully automated process begins with loading and transferring themask or wafer to its inspection chamber. Inside the chamber, the EdgeScan machine uses a sophisticated laser scanning technique directed at the edges of themask or wafer to capture the overall contour and deliver high-resolution images of the material's surface. The EdgeScan tool then creates a profile of defect positions and characteristics, allowing for rapid and accurate defect assessment. The EdgeScan asset employs three distinct inspection technologies — Defect Detection, Surface Profile, and Overlay Analysis — to ensure comprehensive inspections of the mask or wafer surfaces. These technologies allow for both non-destructive and destructive inspections of the materials, further enhancing defect detection capabilities and improving overall defect detection accuracy. The Defect Detection technology captures minute defects on the edge surface of a mask or wafer with the assistance of an advanced optical image processing model. The Surface Profile technology can generate 3D scans of the edge surfaces in order to measure the shape and identify the critical dimensions of the materials. The Overlay Analysis technology is used to detect and measure critical alignment tolerances between multiple layers of a mask or wafer. The EdgeScan equipment also offers advanced data analysis and reporting capabilities, allowing for further analysis of the mask or wafer defects. Its remote data analysis feature enables users to quickly collect, analyze, and compare inspection results from different sites. Additionally, the system can both export resulting data and generate customizable reports that can be used to identify root causes of defects and provide quality control feedback. Overall, RXW-1227 EdgeScan is a powerful mask and wafer inspection unit that is designed to save time and cost, while delivering high-accuracy results. Its automated optical inspection capabilities, advanced imaging technologies, and superior data analysis and reporting make the EdgeScan the ideal choice for industrial semiconductor mask and wafer inspection applications.
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