Used RMB-TECHNOLOGY LSiS 300 #9227862 for sale

RMB-TECHNOLOGY LSiS 300 is an advanced mask and wafer inspection equipment used in the semiconductor industry. It is capable of detecting particle, defect, line-edge, and pattern problems on a range of applications including masks, wafers and thin films such as photomasks, LCDs, MEMS, and OLEDs. LSiS 300 is equipped with a high resolution scan line camera. This high resolution camera is capable of detecting particle, defect, line edge and pattern problems in a range of applications. The system is user friendly and is capable of multiple operation modes including defect inspection, line-edge profile measurement, and defect ranking. The unit is designed to provide high accuracy on a range of resolutions and sampling sizes. The machine is equipped with a powerful inspection algorithm, which is capable of detecting thousands of particles, defects, lines and patterns in a single scan. The tool is also capable of analyzing the size, shape and orientation of any defect. Additionally, the asset is capable of collecting and analyzing data from multiple scans. The model is designed with powerful image processing algorithms which enable automated defect detection. The image processing algorithms can highlight defects and classify them as particles and voids using a variety of techniques. Additionally, these algorithms can detect line-edges with high precision and extract pattern features such as shapes, sizes, spacings, etc. RMB-TECHNOLOGY LSiS 300 is designed with a fully programmable environment which enables users to define multiple inspection parameters, ranging from particle and defect sizes to line edge widths etc. The equipment also features a wide range of data output options including text, CSV, BMP and other image formats. This allows users to easily analyze data from the system. LSiS 300 is suitable for a variety of industrial applications, such as mask and wafer inspection, metrology, die inspection, 3D topography, failure analysis, and many more. This unit is highly reliable and robust, and is capable of providing reliable results. The machine offers a fast, high accuracy and low-cost solution for inspecting a range of semiconductor applications.