Used ROI OMIS II 4x8 #9012196 for sale

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ID: 9012196
RAM optical probe measurement / inspection station.
ROI OMIS II 4x8 is a powerful tool for mask and wafer inspection. It features an advanced macrovision and optical polygon array scanning optics with enhanced resolution, sensitivity and throughput. With 8 different illumination settings, the equipment is capable of inspecting different feature sizes, from small fiducials to large microcircuits. A wide range of exam types, including standard macros and defect reviews, is available. The system also has integrated metrology tools and self-calibrating systems. OMIS II 4x8 is based on a high-speed processor and a 4x8 color CCD array. The optics module integrates a number of optical components, including a set of galvanometers and 4x8 CCDs, a variable zoom lens, a multi-zone LED lighting unit, and an AE mirror. This optics machine is designed to provide high-resolution images with low noise and low distortion. Furthermore, the tool is able to capture FOVs at different orientations. ROI OMIS II 4x8 is capable of collecting 3D data. This is possible thanks to its built-in Digital Volume Replication technology. This powerful tool allows the asset to quickly construct 3D images of chips and track them over a wide range of angles and depths. This powerful feature makes the model ideal for the inspection of wafers and masks. OMIS II 4x8 is capable of performing advanced inspection jobs. Its automated image stitching and image alignment capabilities allow users to quickly measure the parameters of different features in large fields of view. This includes wafer and mask measurements, as well as image overlay and analysis. Also, ROI OMIS II 4x8 has a variety of macrovision capability. This includes defect review, high-accuracy wafer binning, and auto-calibration of the device. The auto-calibration option makes sure that the device is in the right position when taking measurements, making it more accurate. In conclusion, OMIS II 4x8 is an advanced tool for mask and wafer inspection. It is capable of performing a wide range of inspection tasks with its advanced optics equipment, 3D data collection capabilities and macrovision features. All of these features make the system a valuable tool for precise inspections.
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