Used RUDOLPH / ONTO INNOVATION / NANOMETRICS Nano 9010B #293637926 for sale

RUDOLPH / ONTO INNOVATION / NANOMETRICS Nano 9010B
ID: 293637926
Wafer Size: 12"
Thin film thickness measurement system, 12".
RUDOLPH / ONTO INNOVATION / NANOMETRICS Nano 9010B is a wafer and mask inspection equipment used in the semiconductor industry. This advanced system uses a combination of optics and lasers to detect and measure defects and variations in wafers and masks. The unit has three main components: the optical microscope, the vertical laser, and the horizontal laser. The optical microscope component of the machine provides a magnified view of the masks and wafers. By using a visible light source, the optical microscope can inspect for pitting, blistering, delamination and other mask and wafer defects. In addition, the optical microscope can measure the uniformity and accuracy of lines and features on the masks and wafers. The vertical laser component of the tool employs beam-steering technology to inspect for discoloration and other surface defects. The vertical laser can detect surface defect sizes as small as 0.10 μm. The horizontal laser component uses fiber-optic technology to detect problems related to line width and spacing. This component of the asset can identify defects that are as small as 0.04 μm. Horizontal laser beams can also inspect for conductive bridging and large area voids In addition to the three main components, the model includes software that can analyze the data gathered during inspection. This software allows users to create detailed defect maps and reports to document the results of a mask or wafer inspection. RUDOLPH Nano 9010B also includes network connectivity and is capable of storing data securely on an external storage device. The equipment is highly user-friendly and can be easily integrated with other inspection systems. Overall, NANOMETRICS Nano 9010B is a powerful system designed for mask and wafer inspection. Combining the advanced optics and laser technologies, the systems can detect even the smallest defects, thus making it an invaluable tool for semiconductor and other related industries.
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