Used SEMILAB / SDI FAaSt 230 #9355343 for sale

SEMILAB / SDI FAaSt 230
ID: 9355343
Wafer Size: 8"
Vintage: 2001
Metrology tool, 8" 2001 vintage.
SEMILAB / SDI FAaSt 230 is a mask and wafer inspection equipment designed to quickly and accurately detect defects on test wafers, masks, and other semiconductor substrates. The system is capable of detecting particle contaminants, defects on contact pads, open or short circuits, windvoicing, etching, corrosion, and print defects on substrates. It is a fully automated unit with intuitive user-friendly software for quick setup, diagnosis, and reporting. The machine is equipped with a polarized light microscopy (PLM) tool which provides high-quality imaging of semiconductor structures. A built-in optical inspection head with both DLP and back-illuminated optics allow the asset to capture images of structures for defect detection, identification, and analysis. The built-in technologies and algorithms such as automated defect detection and real-time image processing enable efficient and reliable analysis of complex semiconductor structures. Apart from its imaging capabilities, the model also has a comprehensive suite of measurements and features including critical dimension (CD) measurements, failure analysis via inkjet and marker deposits, and oxide film analysis. A dedicated XY-stage allows for precise movement and positioning on samples for better analysis. Additionally, it also comes with multiple digital interfaces, such as USB, LAN, and DPI facilitating integration with peripheral devices and external software applications. The equipment offers the highest level of accuracy and repeatability with its advanced laser-focus technology. Combined with its semi-automatic auto-foil change feature, it allows for rapid data capture and analysis, processing up to 500 wafers per hour. With a deep analysis database and trace files, customers can quickly search through their records and pinpoint possible difficulties encountered on the production line. In addition, the system is certified by organizations such as SEMATECH, IEST-RP-CC002.3, ISO/IEC 24324 and STMicroelectronics, making it an ideal tool for quality assurance and production line analysis. Its ergonomic design allowes for convenient incorporation of various parts of the unit in analytical and production industries. SDI FAaSt 230 is an advanced mask and wafer inspection machine that can provide its users with reliable high-performance results.
There are no reviews yet