Used SEMILAB / SDI FAaSt 300 #9358711 for sale

SEMILAB / SDI FAaSt 300 is a mask & wafer inspection equipment designed to provide precise imaging, inspection and metrology for semiconductor devices. The system is designed to process up to 300mm wafers at a resolution of up to 3.6um. This unit is able to detect defects that are otherwise undetectable to conventional inspection methods. SDI FAaSt 300 utilizes a dual camera machine, allowing it to image a wide range of sample sizes in large numbers. This allows for increased throughput while also ensuring accuracy and precision. The tool can analyze features as small as 3.6um and can detect various types of wafer defects including: contaminants, dislocations, particles, scratches, pinholes, and other micro-defects. SEMILAB FAaSt 300 uses specialized optics and imaging software to ensure the best image quality in demanding production lines. It includes an optical asset for both low-kV and high-kV exposure as well as a specialized application specific imaging software to ensure accurate and precise alignment of inspection areas. FAaSt 300 integrates several metrology functions, including scanning and shape recognition, pattern detection, and defects analysis. It also provides several automated analysis and reporting tools to enable rapid and thorough analysis of the inspection data saved for future reference. The model also provides measuring equipment and motion control for measuring 2-dimensional and 3-dimensional imaging, as well as sample manipulation. Its user-friendly software interface simplifies operation and makes it easy to accurately measure and inspect large die and wafers. In order to keep up with high-volume needs, SEMILAB / SDI FAaSt 300 includes a high-speed wafer transport equipment along with an automated loading system that allows for simultaneous inspection and measurement of multiple wafers in a single unit. Additionally, the machine contains software that continuously updates wafer defects information and displays it in its report. SDI FAaSt 300 is designed for use in high-demand production settings, and is built for accuracy, reliability and speed, making it the perfect inspection tool for inspecting very large and complex semiconductor devices.