Used SEMILAB / SDI FAaSt 330 #33072 for sale
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ID: 33072
Wafer Size: 8"-12"
Vintage: 1999
Wafer characterization system, 8"-12"
Open cassette handling, 8"-12"
Anodized aluminum hot chuck, 12"
Gold plated measurement chuck, 12"
(2) NEWPORT RESEARCH MM3000 Motion controllers
Temperature control box
Corona switch box
I/O Control box
Optocoupler
BNC Switch box
Vacuum / Pneumatic control box
WAVETEK 29 DDS Function generator, 10 MHz
(2) BERTRAN 2341-1 High voltage power supplies
HEWLETT PACKARD Vectra VE6 / 450 Computer
Floppy Disc Drive (FDD), 3.5"
100 GB Jazz drive
MITSUBISHI LXA550W LCD Monitor
OMEGA HX92 Humidity sensor / Transmitter
Plasma damage monitor
Robot, prealigner and controller removed
Power supply: 12 / 24 V
1999 vintage.
SEMILAB / SDI FAaSt 330 is a mask and wafer inspection equipment designed for rapid and highly accurate measurement of printed circuit board imaging. This system uses an optical microscope to provide information about the size, shape and area of each printed layer. The unit also provides visibility and imaging of wiring patterns and solder mask. SDI FAaSt 330 uses a laser-camera imaging machine to capture images with resolution down to 0.12 µm (micrometres). It can measure up to 6m2 of material in a single scan, meaning it can quickly evaluate high quality printings. The camera is connected to a computer tool that enables powerful postprocessing of the images. The software provides a wide range of data analysis capabilities, including the ability to detect shorts, fills and bridging, as well as to measure line width and spacing. SEMILAB FAaSt 330 also uses an edge detection algorithm to detect sharp edges and curves. It offers an edge detection accuracy of 0.24 µm, and can be used to measure from 1 to 60 layers of patterning. The combination of the imaging asset and edge detection algorithm allows for improved inspection of wiring patterns and solder mask. In addition, FAaSt 330 provides various detailed statistical information about the inspected data. This includes the total number of defects, the number of defects per area, and the average defect size. This helps you identify problem elements quickly and in detail. Finally, SEMILAB / SDI FAaSt 330 has a robust user interface, providing an easy way to operate and interpret the data quickly. The model is designed to be used by both engineers and technicians. It also offers an automated peak analysis and alerting capability, which notifies the user when any physical defects are detected. All of these features make SDI FAaSt 330 a powerful mask and wafer inspection equipment.
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