Used SEMILAB / SDI FAaSt 330 #9133013 for sale

SEMILAB / SDI FAaSt 330 is an advanced mask and wafer inspection equipment designed for use in semiconductor fabrication facilities. The system is composed of a modular wafer inspection unit and a powerful chromatic microscopystage. Together, these components enable accurate inspection of semiconductor masks and wafers for a variety of uses in production workflows. The modular SDI FAaSt 330 unit is designed to provide maximum productivity with low technician intervention. The machine features automated sample loading, measuring, and unloading processes that enable operation at high throughputs. The modular design also allows for flexible configurations—the tool can be customized to suit the user's requirements and production environment. The asset's powerful chromatic microscopy enables fast and accurate inspection of the mask and wafer surfaces. The microscope is equipped with a large field-of-view and a high-magnification ranging up to 18,000X. This allows for fast and accurate inspection of chip edges and featurse, which enables quick defect identification. SEMILAB FAaSt 330 model is housed in a robust and reliable enclosure, making it resistant to environmental humidity and dust. The equipment also features advanced software and hardware components, including a specialized defect analysis algorithm, integrated image sensing and image analysis units, and a defect detection system. The intuitive user interface makes it easy to set up, configure, and use the unit. FAaSt 330 machine is designed to be easy to deploy, configure, and manage in semiconductor production facilities. The tool provides quick and accurate inspection performance, allowing for early defect identification and improved production yields. The asset can also be customized to suit individual user requirements and production environments, making it a flexible and reliable solution for mask and wafer inspection needs.