Used SEMILAB / SDI FAaSt 330 #9261423 for sale

SEMILAB / SDI FAaSt 330 is a mask and wafer inspection equipment designed to provide highly accurate and reliable defect detection results. It is the go-to choice for semiconductor manufacturers, as it offers excellent performance, versatility and cost-effectiveness. SDI FAaSt 330 utilizes advanced pattern recognition algorithms to detect and assess defects on the mask, wafer, material and substrate. A high resolution CCD camera captures images of mask or wafer samples, while a numeric zone inspection procedure isolates any potential defect features. This information is then analyzed by a powerful digital processor to generate detailed defect maps. The FAaSt system uses an intuitive interface to ensure accuracy and efficient defect mapping. Advanced defect detection technology is also employed to accurately map and analyze optical contrast variations in critical defects, even in difficult areas such as eyes, corners and edges. This technology eliminates background noise and false alarms, ensuring the most accurate results. As a result, SEMILAB FAaSt 330 can provide advanced 3-dimensional and 2-dimensional defect observations. The device is designed to be quick and easy to install and operate, while providing maximum user control and accessibility. Its modular architecture provides efficient defect examination and reporting. Additionally, the FAaSt unit is equipped with an auto-focus feature which enhances the ability to detect very small defects. FAaSt 330 mask and wafer inspection machine is an ideal choice for semiconductor manufacturers and other related industries. Its advanced design, versatile technology and intuitive interface enable users to perform highly accurate and reliable inspections with superior results. As a result, SEMILAB / SDI FAaSt 330 is one of the most reliable and cost-effective mask and wafer inspection systems available.