Used SEMILAB / SDI FAaSt 350 #9308156 for sale

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ID: 9308156
Wafer Size: 12"
Wafer characterization system, 12".
SEMILAB / SDI FAaSt 350 is an advanced automated mask and wafer inspection equipment that is designed to meet the highest requirements in the semiconductor industry. It provides a comprehensive inspection solution that offers both static and dynamic measurements with high accuracy and repeatability. The system utilizes advanced camera and lighting technology to ensure that detailed images can be captured and analysed with a high degree of accuracy. This unit comes with an innovative optical design which combines bright-field, dark-field and UV illumination systems to examine objects at the µm and nm scale. It is also able to inspect transparent and translucent objects with t heir translucent properties fully visible, allowing for easier multi-die inspection. In addition, the machine maximizes throughput by incorporating a quick-change cassette and a large sample holder. This eliminates the need to move and measure each sample, as the sample remains fixed in the same position throughout the measurements. The tool is also user-friendly and intuitive to operate. Furthermore, the asset is capable of identifying a wide range of defects such as non-uniform patterns, scratches, pinholes, contamination, voids and damage. It maintains ultra-high resolution of 0.2µm and consistently reproducible results. To ensure accuracy, the model is provided with a high-end digital image-processing processor. The advanced optics and illumination equipment allows easy alignment to the sample and intensity of the illumination. SDI FAaSt 350 system is designed for reliable and fast failure analysis. It is ideal for use in production or back-end optical inspections. It is suitable for use in various challenging applications such as wafer-level defect detection, flip-chip assembly inspection and more. The unit ensures quality inspection and superior yields, making it an efficient and cost-effective mask and wafer inspection solution.
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