Used SEMILAB / SDI WT-2000 #293763241 for sale

SEMILAB / SDI WT-2000 is an advanced mask and wafer inspection equipment designed to provide fast, reliable and accurate analysis of wafer defects. The system supports standard planar defects (e.g. dislocations and pits), as well as 3D point defects (e.g. isolated sites). The unit is equipped with robust optoelectronic modules, featuring advanced 256-channel illumination, automatic focus and exposure optimization, a multi-channel color filter wheel and smart pixel interpolation algorithms. This, combined with a high-resolution CCD camera, allows SDI WT-2000 to capture high-resolution images with outstanding detail. The machine's user-friendly software provides an intuitive graphical user interface, allowing users to quickly set up, execute and analyze mask and wafer inspections. Features include real-time defect detection and classification, plus detailed statistical summary and defect distribution analysis reports. The software allows users to increase productivity and efficiency by automating the inspection process through template-based inspection. It also offers powerful graphical tools and customizable rules and settings, so users can adjust the tool to their needs. SEMILAB WT-2000 is a modular asset, allowing users to add modules depending on their unique application and test requirements. This includes software modules such as SIPI (stereo imaging processing inspection) or Augmented Reality (AR), which empowers the user to interact with the live, 3D scanned images. There is also an optional automation package, allowing for the automated loading, sampling and sorting of inspected samples, plus advanced defect analysis and defect review with automated export of detailed reports. WT-2000 provides a cutting-edge solution for applications such as dielectric, optical, optoelectronic or transistor wafer inspection, lithography defect inspection, gallium nitride (GaN) LED chip inspection, memory wafer inspection and more. It offers unprecedented image quality, features both standard visual and advanced optical inspection, and automates many processes, resulting in increased inspection efficiency and accuracy.