Used SEMILAB / SDI WT-2000 #293808462 for sale

SEMILAB / SDI WT-2000
ID: 293808462
Measurement system, parts machine.
SEMILAB / SDI WT-2000 is a state-of-the-art semi-automated mask and wafer inspection equipment with a myriad of features designed to ensure reliable and accurate performance. This highly versatile system can perform both mask and wafer inspections with high-performance optical imaging tools and automated feature extraction algorithms. It is equipped with a 12" size LCD display and can reach up to 25,000 pixels per second in resolution, ensuring an incredibly high level of detail and clarity in the images captured. SDI WT-2000 also boasts a large working window allowing for the simultaneous inspection of multiple samples. This unit is well-suited for use in a range of applications including semiconductor and optical product manufacturing, as well as quality control and reverse engineering. It is capable of detecting surface defects and pattern edginess at magnifications of up to forty times with a precision of 2 nanometers. A pattern overspread measuring capability of up to one thousand to one is available and the machine is designed to accommodate both horizontal and vertical and circular patterns. SEMILAB WT-2000 is equipped with a host of features that enable efficient and easy operation, such as an on-screen viewing window, navigation aid, and an array of image-processing functions. The tool itself is relatively compact, possessing a shallow manual-tilt stage and an adjustable-height stand that are perfect for the confines of tight working spaces. The robust frame and construction of WT-2000 ensure durability and stability, even when undergoing heavy-duty operations. Additionally, the asset is fully integrated with a multi-purpose data management software package. This tool is capable of archiving, retrieving, and retrieving inspections data, allowing users to quickly and easily identify issues and analyze data accurately. SEMILAB / SDI WT-2000 is an exceptional tool that is capable of replacing a number of traditional tools used to perform mask and wafer inspection. Its combination of portability and robust performance makes it an ideal choice for a range of industrial applications. By leveraging the advanced optical imaging tools, automated feature extraction algorithms, and the integrated data management software of SDI WT-2000, manufacturing and quality control processes are improved drastically.
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