Used SEMILAB / SDI WT-2000D #293759095 for sale

SEMILAB / SDI WT-2000D mask and wafer inspection equipment provides incredibly detailed measurements of metal features, resist features and optical inconsistencies on masks and wafers. It is specifically designed to determine any irregularities that justify a retouching process of a device and enables fast and accurate graphic patterns recognition, allowing for improved accuracy of sample analysis and quality control. The system allows for fine control of parameters such as magnification, measuring range, line spacing, chart speed, field of view, and more. This allows SDI WT-2000D to carry out a variety of tests and dimensional measurements accurately and quickly. The multi-parametric analysis approach is suitable for a wide range of applications, including mask defect analysis, sidestep and line cross section analysis, die shape and edge geometry analysis, line width analysis, and even more complex images tests. The unit boasts a fully automated and integrated magnifier with mechanical stages and a powerful precision camera machine. This ensures that all components of the tool are compatible, allowing for accurate measurements and photo alignment even for indistinguishable objects. In addition, it has a user-friendly graphical user interface which provides an easy-to-use control panel and shortcuts for more complex tasks. SEMILAB WT-2000D also offers a proprietary image calibration that compensates for errors caused by lens distortions or incorrect focusing. The resulting image is much more reliable and accurate during the analysis process. The wide range of magnification available (up to 1000X) allows for precise analysis even of minuscule features of the sample. Overall, WT-2000D mask and wafer inspection asset is an ideal choice for those who are looking for an efficient, reliable, and accurate way to detect defects on masks and wafers. Its multi-parametric approach and powerful magnifier and camera model provide users with enough flexibility to carry out a wide array of tests quickly and accurately.