Used SEMILAB / SDI WT-2000PVN #293652638 for sale

SEMILAB / SDI WT-2000PVN is a fully automated mask and wafer inspection equipment for processing wafers in production settings. It combines high-resolution optical imaging and digital imaging technologies to accurately measure, inspect and detect defects on a wide range of substrates, including GaAs, SiC, InGaAs and polysilicon. The user than configures the system to the type of substrate and the defects or features of interest. The unit can detect particles and particles up to 15 microns in size, as well as sub-micron particles and pattern recognition to identify irregular patterns. The images can be observed in real time or in split-screen comparison mode. The machine is equipped with a high-speed wafer scanner that is capable of scanning both panoramic and high-resolution images. The scan rate can be adjusted to achieve a scanning speed of up to 120mm/sec, and a maximum resolution of 0.125 micron. SDI WT-2000PVN tool is also equipped with a fluid control unit that ensures an uninterrupted and even flow of liquids during the imaging process. The fluid is critical for maintaining a consistent level of contrast between the background and the wafer, allowing for an accurate and reliable analysis. The asset also features an automatic wafer loading and unloading model, which allows for faster, more efficient production. The automatic wafer handling equipment can manage multiple wafers of different sizes with ease. The system offers an intuitive and user-friendly graphical user interface (GUI). The user can configure parameters and specify images for analysis without the need for complex programming. The unit also allows for remote monitoring and data exchange with other manufacturing systems. SEMILAB WT-2000 PVN is a powerful and reliable mask and wafer inspection machine. It offers superior image quality, high-speed scanning, accurate inspection, and flexible configurations. This makes it an ideal solution for manufacturers requiring a reliable, easy-to-use, and cost-effective inspection method.