Used SEMILAB / SDI WT-2000PVN #293758025 for sale

ID: 293758025
Measurement system.
SEMILAB / SDI WT-2000PVN is a mask and wafer inspection equipment that is designed to inspect and analyse masks, wafers, and substrates with high-resolution optics. The system utilises a Quadralign™ automated alignment method to properly align the optics and improve inspection accuracy. The unit employs a LED light source that emits a low-wavelength light spectrum for image capture. This light source provides high-resolution images that are suitable for single layer mask inspection as well as image analysis. It is equipped with an integrated digital microscope for performing wafer inspection and inspection of patterned specimens. SDI WT-2000PVN boasts a large 22-inch screen monitor that has a touchscreen for easy menu navigation and data selection. It is compatible with both Windows and OS X operating systems. The machine also supports a variety of international standards and protocols such as GDSII, OASIS, STDF, and CIF. SEMILAB WT-2000 PVN is designed for use in any environment, from research and development to manufacturing to quality control, with its large capacity scan stage. This inspection tool can detect voids, bridgings, scratches, dislocations, and other defects in substrates, masks, and wafers. The asset includes a defect discriminator feature which can identify potential defects and flag them for further analysis. It also supports an image export and analysis feature which can be used to accurately measure any suspicious areas and present the results in a clear format. SEMILAB WT-2000PVN offers exceptional performance and reliability, thanks to its industry standard electrical safety certification. The model is designed for use in a wide variety of industries such as semiconductors, flat display technologies, and integrated circuit design. Overall, WT-2000 PVN is an ideal mask and wafer inspection equipment for inspecting critical mask, wafer, and substrate applications. It is user friendly, boasts a large inspection area, high-resolution image capture technology, and defect discriminator feature, making it an ideal choice for quality control.
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