Used SEMILAB / SDI WT-2000PVN #9227867 for sale

ID: 9227867
Measurement system.
SEMILAB / SDI WT-2000PVN Mask & Wafer Inspection equipment is a multi-sensor inspection system that utilizes optical and dimensional metrology technologies to detect various defects including particle contamination, foreign material, warpage, scratches, pits, and general surface conditions. The unit is specifically designed for the analysis of wafer-level or die-level chips, as well as optoelectronic devices such as MEMS, LCDs, and 3D packages. SDI WT-2000PVN allows users to quickly inspect large areas of wafers or chips with high accuracy thanks to its high-resolution optical sensor and precise dimensional measurements. The machine features an ergonomic design with easy to use touchscreen controls that make it simple to select the correct test parameters for each application. The highly integrated tool also features a variety of automated mechanisms for sampling and controlling the test environment, ensuring consistently high accuracy and reliability. Additionally, its automated image colorization process further improves the overall contrast of the images, allowing users to more easily detect defects. SEMILAB WT-2000 PVN Mask & Wafer Inspection asset provides reliable and efficient analysis of large quantities of chips and optoelectronic devices for a wide range of applications. The model offers high accuracy, repeatable results and ease of use, making it the ideal solution for chip manufacturers, mask makers, and other electronics applications.
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