Used SEMILAB / SDI WT-2000PVN #9372955 for sale

SEMILAB / SDI WT-2000PVN mask & wafer inspection equipment is a comprehensive optical inspection system designed for automation of the mask and wafer inspection process. The unit uses a unique lithography technology to detect defects on the mask or wafer in a fast and reliable way. It is capable of bringing the inspection process from prototype to full production process efficiency. SDI WT-2000PVN is equipped with a powerful HD CCD camera and scanning machine for capturing high-resolution images and automatically detecting, analyzing, and reporting defects on masks and wafers. The machine can be configured for various applications such as substrates used for General Semiconductors, ULSI, MEMS, Micro Imaging and Bio-devices. The tool can identify various types of defects such as scratches, pinholes, contamination, particle contamination, burrs, torn grain boundaries, voids, uplift, dust, cataracts, chipped grain, side boxes, voids, and many more. The mask & wafer inspection asset provides an intuitive, graphical user interface (GUI) for operators to easily control and operate the machine. It enables operators to define the process parameters and review the generated data. In addition, an extensive library of user-defined test patterns and settings is provided to cover different applications. The model is equipped with advanced algorithms for defect location and classification with multiple vision paradigms, enabling automated identification of various defect types. A powerful defect analysis engine is used to compare images of the specified masks and wafers to a library of reference standards at a speed of up to 1000 images per second. Additionally, image data can be saved and exported in the desired format for archival purposes. SEMILAB WT-2000 PVN equipment is capable of performing mask and wafer inspection with a high degree of accuracy and precision. Its advanced features ensure reliable results while significantly reducing the time needed for inspection tasks.