Used SEMILAB / SDI WT-2010D #9267612 for sale

SEMILAB / SDI WT-2010D mask & wafer inspection equipment is a high-precision imaging system designed to provide complete, repeatable imaging and data collection of feature sizes within integrated circuit masks & wafers. The unit is designed to quickly and easily inspect these materials for any anomalies or defects. SDI WT-2010D is comprised of a flexible X-Y scanning stage and a powerful optical machine - both of which work together to enable fast, accurate imaging of small-scale features on mask & wafer surfaces. The scanning stage is driven by a highly efficient X-Y micro-scanner, which can move the stage in X and Y directions in precise incremental steps. The motorized drive ensures smooth, accurate motion during scanning and image capture. SEMILAB WT-2010D optics tool utilizes a fully customizable trioptic asset. This model consists of three separate high-resolution lenses - each with its own finite adjustment capabilities, allowing the user to precisely adjust the lens for magnification, field of view, and numerical aperture. The lenses provide clear, detailed images with even the smallest features appearing sharp and crisp. WT-2010D equipment also includes an advanced imaging system. The 150-megapixel CCD camera and imaging board is capable of recording up to 10,000 pixels/second. This allows the unit to capture detailed images of small-scale features in extremely fine detail. The data collected from the imaging machine is then processed through an automated full-step feature inspection tool. This asset processes and analyzes the images for any anomalies, defects, or deformities that may exist. The output of this model provides a real-time snap-shot of the specimen that is viewable on a 21-inch LCD flat-panel monitor. To ensure that the data collected from the equipment is consistent and accurate, SEMILAB / SDI WT-2010D system includes a full suite of powerful software. This software includes image and data comparison tools, statistical and graphing tools, automatic processing functions, and analysis utilities. All of these components allow the user to quickly and easily identify any defects or discrepancies in the sample material. In conclusion, SDI WT-2010D unit is an easy-to-use, highly accurate imaging machine designed specifically for effective and efficient mask & wafer inspection. Along with its X-Y scanning stage, trioptic optics tool, powerful imaging asset, and comprehensive software suite, SEMILAB WT-2010D model provides a comprehensive means of inspecting and analyzing small-scale features on these materials.