Used SEMILAB SPVCMS4000 #9391959 for sale

SEMILAB SPVCMS4000
ID: 9391959
Metrology system.
SEMILAB SPVCMS4000 is a state-of-the-art mask and wafer inspection equipment that is designed for the most demanding process and inspection requirements. It offers a unique combination of technologies including surface and topography inspection, feature recognition, and defectivity analysis. SPVCMS4000 is driven by an intuitive and high-performance software which enables the user to quickly and accurately perform reliable inspection on a variety of processes including FEOL, BEOL, DRAM, and 3D. The system is capable of delivering sub-20nm resolution in its surface and topography inspection modes, and features an ultra-sensitive photo-reflective CCD sensor that offers superior accuracy when inspecting sample features. Additionally, the unit can detect small-sized defects with an excellent signal-to-noise ratio. Feature recognition is enabled by the advanced tracking algorithms that monitor the position of features on the sample wafer, even in the presence of ambient noise, thereby allowing for faster and more precise inspections. SEMILAB SPVCMS4000 is powered by a 10.4" color touchscreen display that gives users full control over the machine's settings. It is designed to optimize throughput with its dual-arm operation which minimizes de-tension usage and enables operators to quickly inspect multiple wafers in sequence. The tool also features a wafer auto-loading asset that enables it to load and unload wafers quickly and easily. In addition, SPVCMS4000 is equipped with a high-resolution camera that is capable of capturing defects with an efficiency of up to 4K resolution. This feature allows users to inspect complex patterns and structures with unparalleled precision. Additionally, the model includes powerful image processing and analysis techniques that can detect, locate, and accurately identify defects. The equipment also provides real-time feedback on data which includes defect size, particle density, die size, and other important information. This comprehensive feature set makes SEMILAB SPVCMS4000 an ideal choice for the most demanding mask and wafer inspection applications.
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