Used SEMILAB WT-2000PV #9409920 for sale

SEMILAB WT-2000PV is an advanced mask and wafer inspection equipment. This system is designed to accurately measure the thickness and curvatures of masks, wafers, and other substrates with precise accuracy and repeatability. SEMILAB WT 2000 PV is suitable for inspecting device structures such as micro vias, gates, contacts, and contactless structures. It also provides support for a variety of wafers, including Silicon, Glass, Silicon-on-Insulator (SOI), and Polyimide. WT-2000PV utilizes SEMILAB patented piezo drive unit for superior stability and precise positioning of wafers and other substrates. This advanced drive machine provides motion resolution as low as 2.5 nanometers and is optimized for precise surface curvature and pattern deformation measurements. The tool also features a high-resolution optical measurement capability, providing measurements in the range of 10 nanometers to 10 microns. WT 2000 PV employs a variety of hardware and software features designed to improve its performance. These include a high quality optical microscope for precise measurements and imaging. It also includes advanced image processing and feature extraction algorithms, allowing for accurately locating structures and quantifying their shapes. SEMILAB WT-2000PV's advanced measurement capabilities also include surface conformality and texture analysis, allowing for accurate measurements of different parameters like profile and roughness. The asset includes SEMILAB Optimizer software, a powerful tool for customizing user-defined process parameters. The model also comes with a fully upgradable library of algorithms to cover a variety of process needs. SEMILAB WT 2000 PV is designed for intuitive operation and provides a wide range of features for critical evaluation of mask and wafer parameters. To maximize its performance, the equipment includes an advanced user interface, allowing users to easily control the system and its settings. The unit also comes with comprehensive documentation and online tutorials to assist users in mastering the machine. In summary, WT-2000PV is an advanced mask and wafer inspection tool with high-precision measuring capabilities. It is suitable for precision measurements of different parameters, including surface conformality and texture, and includes powerful software tools and a user-friendly interface. WT 2000 PV is a powerful asset for task-specific measurements in semiconductor metrology.