Used SEMITEST Epimet II #293646413 for sale

SEMITEST Epimet II is a mask and wafer inspection equipment for the semiconductor industry. It provides automated inspection, quality inspection, and metrology of a wide range of wafers and thin films. The system is designed to optimize the accuracy and quality of the product. The unit utilizes advanced scanning electron microscopy (SEM) techniques to provide high-resolution inspection and quality control of wafers and thin films. It is designed to inspect materials that are as thin as a few microns. Epimet II is equipped with an array of advanced detectors, including backscatter detectors, secondary electron detectors, and micro-focuses X-ray detectors, that enable maximum resolution. The machine integrates advanced positioning and sample manipulation capabilities, allowing the user to accurately view, measure and inspect features of the wafers and thin films. The integrated stage enables fast and accurate sample positioning while providing an ample working load capacity. SEMITEST Epimet II also incorporates advanced digital image processing algorithms extensive image analysis capabilities. This allows the user to easily identify and measure defects and anomalies using real-time, digital capture and display capabilities. The tool also includes user-friendly software tools which enable inspection of the entire wafer surface and enable the user to identify, classify, and measure defects with maximum accuracy. The asset also delivers capabilities for process control, quality testing, and metrology tasks. The integrated metrology capabilities enable users to accurately measure the wafer thickness, surface topography, and other relevant information. Additionally, the model is capable of accurately measuring 3D features and can acquire images of focused ion beams. In addition, Epimet II provides a variety of diagnostics and tests, including leakage current, mask inspection and analysis, die size verification, stress measurements, electrical test patterns, scan speed measurement, and more. These tests ensure product consistency and quality and help to simplify the process of development and manufacturing. Overall, SEMITEST Epimet II is an advanced wafer and thin film inspection equipment designed to maximize accuracy, quality and productivity. With its advanced detectors, positioning and sample manipulation capabilities, digital image processing, and the integrated metrology capabilities, Epimet II provides a powerful solution for the semiconductor industry.