Used SIGMAMELTEC MRC 8000 #9304303 for sale

SIGMAMELTEC MRC 8000 is a high-precision mask and wafer inspection equipment that provides the highest levels of automated accuracy, quality control, and reliability. It is a state-of-the-art combination of optical and acoustical imaging technologies for assessing IC mask accuracy and functionality. MRC 8000 High Resolution Microscope (HRM) allows for the pinpoint inspection of defect features on wafers and masks to the highest precision possible. The integrated optics system employs a 10x HRM and a 1x Brightfield/Darkfield unit for defect inspections of mask patterns and measurement of features. This enables the machine to perform small defect inspections in very small areas. SIGMAMELTEC MRC 8000 also employs proprietary imaging software algorithms to accurately detect, measure, and analyze defects down to the micron level. These algorithms can detect subtle features such as thin film bridges, solder mask resin shrinkage, etc. Additionally, MRC 8000 can rapidly determine particle size distribution of contaminants in areas such as silkscreen, solder mask, and other defects with its integrated particle size detector. This detector can detect particles as small as 0.1 microns, allowing for extremely precise analysis. SIGMAMELTEC MRC 8000 has a high speed liquid crystal diode (LCD) display for exact defect visualization. This LCD is used to visualize details such as mini bridge defects and sub-micron particle flow. To provide the highest levels of quality assurance, MRC 8000 has several advanced measurement and sampling tools such as a sample preview window, sample selection window, and measurements window. These tools allow for rapid decision making based on measured data and visual images. In summary, SIGMAMELTEC MRC 8000 is a high-precision tool for mask and wafer inspection and quality assurance. Equipped with an integrated optical and acoustic asset, and advanced software algorithms, it enables meticulous analysis of defect features and particles, and provides precise measurements of miniscule features. With its high speed LCD display, it provides the most accurate visualization of defect features and particle distribution. It is therefore an ideal model for defect detection and quality assurance.