Used SII NANOTECHNOLOGY / SEIKO Xvision #9383149 for sale

ID: 9383149
Vintage: 2011
Defect inspection system 2011 vintage.
SII NANOTECHNOLOGY / SEIKO Xvision is a leading mask and wafer review equipment that is designed for high volume production of high-performance integrated circuits (ICs). It uses advanced imaging technology, software control and precision robotics to automate the inspection and review processes for both masks and wafers. This enables IC manufacturers to boost their yield and time to market performance with rapid visual inspection of even the smallest features. SEIKO Xvision is the perfect choice for inspecting and reviewing masks and wafers in high-volume production environments, thanks to its impressive speed and accuracy of its automated operation. The system uses high-resolution optics, which together with precise robotics and advanced software control, allow it to accurately detect even the smallest feature sizes and tolerances on the mask or wafer. To ensure accuracy, SII NANOTECHNOLOGY Xvision utilizes a sophisticated algorithms and features, built into the user interface. The user can customize the unit to match their individual needs, by selecting from a variety of algorithms that work together to provide unique insights into the mask and wafer information. For instance, the machine can be programmed to identify and highlight subtle features in mask or wafer patterns that can be easily missed by conventional inspection methods. The tool also boasts a range of advanced features that are designed to ensure reliable operation and maximum accuracy. For example, Xvision supports the use of live data to correct errors on the mask or wafer. In addition, the asset offers a range of advanced automation and planning tools, which can be used to maximize inspection speeds and reduce the total time required to review a complete wafer. Furthermore, SII NANOTECHNOLOGY / SEIKO Xvision is equipped with an enhanced safety model to ensure that it is safe to operate in any environment. This equipment includes a range of sensors that detect any unexpected events, such as sudden changes in vibration or power, and activate an immediate shutdown mechanism. SEIKO Xvision is an innovative and versatile mask and wafer review system, offering IC manufacturers a reliable and efficient solution for their high-volume inspection requirements. With its advanced optics, robotics, algorithms and automation capabilities, the unit is capable of accurately detecting and troubleshooting even the smallest defects on a mask or wafer, enabling a successful IC production process.
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