Used SVG / PERKIN ELMER / BSL 661HT #9148931 for sale

SVG / PERKIN ELMER / BSL 661HT is a mask and wafer inspection equipment geared toward the semiconductor industry. It is specifically designed to provide advanced, automated inspection capabilities with maximum accuracy and speed for the entire photomask/wafer manufacturing process. It has a modular design, with the flexibility and potential to integrate custom-made features to suit the individual needs of the customer. The system utilizes the most up-to-date industry standards with advanced vision-guided inspection techniques. This allows operators to accurately inspect the masks and wafers down to a column pixel size of 5 microns. Its microscope-ba ed, 3D imaging delivers high-resolution results with automated, high throughput levels of accuracy and speed. The functions of SVG 661HT include mask inspection, wafer inspection, photoalbum inspection, and defect counting. The unit also offers advanced pattern recognition and measurement features, such as isolated pattern recognition, lens correction, automatic recognition of suspicious patterns, traceability, and multiple-part alignment. Its powerful image processing capabilities allow for the detection of defects and contaminants, counting of defects and chips, and layout verification. The machine can also be optionally integrated with a variety of mask inspection systems in order to supplement or extend the systems' capabilities. In terms of handling time, BSL 661HT tool has a transfer time of 200 nanoseconds for shortening the inspection cycle and has a parallel process time of 400 times faster than other competitors for faster scanning. The asset also capable of high-speed mask production and probing with improved throughput performance for faster cycle times. Lastly, the model has a user-friendly environment with intuitive control software, so inexperienced mask/wafer inspection personnel can easily run and manage the equipment. In addition, a set of user-friendly tools, modules, and test pattern libraries are available to cover various feature types (line, via, pad, and more) so that users can conveniently tailor the specific needs of their application.