Used TAYLOR HOBSON CCI MP-HS #293654291 for sale

TAYLOR HOBSON CCI MP-HS is a mask and wafer inspection equipment designed to provide high-resolution inspection of opaque and semi-transparent mask, wafer and reticle coatings. This mask and wafer inspection system can be used for both production and development/R&D applications. It is an automated unit that is integrated with robust and reliable imaging technology with advanced software. This machine is capable of capturing high-definition images with maximum efficiency. CCI MP-HS provides an inspection resolution of 5µm for opaque masks and 40nm for thin film stacks with a high dynamic range of 10,000:1. The tool provides programmable focus which can be adjusted as per the evidence to be captured. It also offers high-speed inspection up to 1,000 wafers/ hour and can perform both standard surface and 3D physical defect inspection, as well as parametric and mapping analysis. TAYLOR HOBSON CCI MP-HS is compatible with several different types of materials, including Si, SiGe and III-V materials, as well as oxides, nitrides, polymers, and Cu metallization layers. Additionally, the asset is able to detect microdefects and transparency issues which helps to increase yield, optimize product performance and reduce cost. CCI MP-HS has a patented stacked lighting technology which allows for quality surface inspection of complex samples, from light thin films to wafers with multi-angular structures. Moreover, the model's illuminating lenses enable the user to tailor the illumination according to the specific requirements of the sample, offering higher resolution, contrast and depth of focus. In addition to its portable design, the equipment integrates with a variety of software packages, such as OTF Autofocus and Edge Trace, which provide automated and manual sample alignment, allowing it to reduce human intervention while maintaining a high-level of accuracy. The software also provides a low false-alarm rate and powerful software analysis capabilities to provide high-quality inspection results on a wide variety of sample conditions and materials. Overall, TAYLOR HOBSON CCI MP-HS provides high-resolution imaging and powerful software analysis tools to ensure quality and accuracy of mask and wafer inspections. This system is an ideal solution for integrated production lines and offers automated, efficient and cost-effective mask and wafer inspection.