Used TAYLOR HOBSON PGI 840 #9397839 for sale

TAYLOR HOBSON PGI 840
ID: 9397839
Aspheric surface measuring instrument.
TAYLOR HOBSON PGI 840 is an advanced automated mask and wafer inspection equipment designed to detect defects on semiconductor wafers and masks. The system is capable of inspecting wafers of up to 200mm in diameter and masks up to 8" in size. PGI 840 has a fully automated control unit and customized software package that is designed to ensure accuracy and reliability in the inspection process. It has several inspection modes and various settings that can be customized to meet specific customer requirements. The machine utilizes a powerful lens tool to inspect wafers and masks for defects. The lens asset can detect defects down to 0.1 microns in size. The wafer and mask images are then transferred to a large image monitor where they can be reviewed and analyzed. TAYLOR HOBSON PGI 840 also features a powerful defect classification model that is able to accurately classify defect types and sizes. This feature allows for a more efficient and accurate inspection process. The equipment also features an extensive database of defect types and sizes that can be used to aid in the detection and analysis of defects. This database can also be used to develop experiments and standardize instructions for specific processes and procedures. In addition to inspection capabilities, PGI 840 also offers a variety of analysis functions. This system is capable of performing gap measurements and die-boundary scans, detecting uniformity defects, and analyzing defect distributions. TAYLOR HOBSON PGI 840 is a highly advanced mask and wafer inspection unit that is designed to provide a high level of accuracy and reliability in the inspection process. Its wide range of features and capabilities make it an ideal choice for semiconductor companies looking for an automated inspection machine.
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