Used TERCHY MHU-150CJ #9247159 for sale

TERCHY MHU-150CJ mask & wafer inspection equipment provides fast and accurate automated inspection of masks and wafers for defects. The system is designed for both direct and indirect inspection of advanced device structures up to 1 micron features, and high-speed mask and wafer inspection. MHU-150CJ has a variety of inspection options including high-resolution imaging, low-magnification metrology, pattern recognition, and 3D profile measurement. The unit offers resolution up to 1 micron and high sensitivity, enabling clear observation of fine patterns and high accuracy defect detection. It also features auto-focus and auto-alignment to ensure optimal image quality and defect detection accuracy. The high-resolution imaging and low-magnification metrology capabilities cover inspections such as pattern line widths, developing hole shapes, clearances, and positional accuracy. The pattern recognition feature is used to check for design errors in layouts, allowing for early detection of major design problems. The 3D profile measurement can detect out-of-flatness and pattern conversion errors in masks and wafers. The machine offers a number of convenient features for easy operation and higher throughput. The user interface provides visual data display along with graphical controls and menus for quick operation. The tool can detect wafer and mask patterns with auto optimization settings for increased detection capability. It includes an automatic job save/load function for efficient and accurate data analysis. The high-speed image processing capability helps to reduce post-inspection image analysis time. TERCHY MHU-150CJ is a reliable and effective inspection asset that will help to ensure the quality of your masks and wafers. With its fast operation and various inspection options, it can provide a reliable and productive solution for mask and wafer inspection.