Used TOKYO AIRCRAFT MEASUREMENT MAC-90 #293587747 for sale

TOKYO AIRCRAFT MEASUREMENT MAC-90 is a mask & wafer inspection equipment that gives consistently true and measurable results. It is a vital component of any modern semiconductor material processing facility. The system comprises of four primary subsystems: the Frame Subsystem, the Analyzing Subsystem, the Sorting Subsystem, and the Wafer Subsystem. The Frame Subsystem is responsible for the physical measurements of the mask & wafer. The unit employs various sensors, such as an ultrasonic thickness gauge, a dielectric patch meter, and a chamfer inspection sensor, to precisely measure the mask & wafer's dimensions and characteristics. It also includes an integrated micro-computer and user interface to guide the user through the process of inputting measurements and running comparative testing. The Analysis Subsystem is essential for performing objective analysis of the mask & wafer. The machine consists of special algorithms that can detect defects, such as cracks, voids, non-uniform surface features, and inclusions. The information gathered by this subsystem is then used to determine the overall quality of the material and help determine the best possible means for processing it. The Sorting Subsystem is integral for categorizing masks & wafers based on their size and quality. After analyzing the material with the Analysis Subsystem, the Sorting Subsystem can divide the material into categories such as "low quality", "high quality", "very low quality" and "very high quality". Finally, the Wafer Subsystem is responsible for accurately measuring the shape of the wafer. This subsystem uses powerful algorithms to detect changes in surface features and detect flatness and surface areas. The information gathered here can be used to help determine the wafer's suitability for use in a production line. Overall, MAC-90 is an essential component of any modern semiconductor material processing facility. By combining the Frame, Analyzing, Sorting, and Wafer Subsystems, the tool is able to provide consistently true and measurable results. In addition, its powerful algorithms and integrated micro-computer enable the asset to detect and categorize masks & wafers with great precision.