Used TOPCO 300EX S250 #9219401 for sale

TOPCO 300EX S250 is a mask and wafer inspection equipment designed to provide powerful analysis and review capabilities to the mask and wafer process industries. The system includes powerful software and hardware components that enable the user to acquire, inspect, analyze, and review images from various mask and wafer sources. The unit is comprised of several components, including a robust camera, a high-speed video controller, an image processor board, and a fully integrated user interface. The camera is designed to acquire digital images of mask and wafer patterns and provide real-time quality measurements and analyses. The video controller provides a large image capture area to ensure that each image acquisition is accurate and complete. The image processor board enables custom-tailored image processing functions to accommodate specific inspection requirements. The user interface of 300EX S250 is a powerful graphical user interface (GUI) which offers a user-friendly environment that simplifies the workflow for mask and wafer inspection tasks. It contains features such as an image viewer with standard spatial analysis tools, an integrated ruler, and pattern recognition capabilities. The GUI is designed to run natively under Windows 2000 and supports OLE and communication protocols such as RPC/COM, TCP/IP, and ODBC. In addition to its basic functionality, TOPCO 300EX S250 also includes specialized features that enable the user to detect tiny flaws, such as pinholes, small unfilled spaces, and the presence of dead pixels. The capabilities of the machine enable quick and accurate data acquisition and analysis, allowing users to spot defects and quickly address them. In conclusion, 300EX S250 is an effective and reliable mask and wafer inspection tool that is designed to provide powerful tools that help streamline the process and ensure high-quality results. With its robust software and hardware components, it enables users to perform accurate and detailed inspections and quickly identify and address any flaws that may exist.