Used TOPCON VI-4302 #9266628 for sale

TOPCON VI-4302 is a highly advanced mask and wafer inspection equipment that can provide high-quality results quickly and accurately. It is designed for both front and backside inspection, as well as hybrid dual face and edge inspection. VI-4302 is an excellent choice for aiding in the quality assurance of heterojunction bipolar transistors (HBTs), solar photovoltaic cells, and other applications. The system has a powerful image processing unit that supports multiple page views, with up to 4 million pixels per page and up to 128 images in a single-layer inspection stack. It also has an image magnification module that supports up to 5X digital zoom and an advanced data-analysis algorithm that can accurately locate and measure any defects on a wafer. TOPCON VI-4302 also incorporates a patented light imaging technique called bright field TIRF (total internal reflection fluorescence). This allows for the detection of TIRF reflection as well as providing superior contrast in imaging. Furthermore, the unit is equipped with a filtering module, which allows for the filtering of light sources to improve the signal-to-noise ratio for enhanced imaging. The machine also has an LED light source and is designed for applications requiring enhanced metrology. VI-4302 boasts an advanced defect-detection algorithm that can detect up to 8-bit pixel values within frames of defect images, allowing it to detect an array of defect types. TOPCON VI-4302 is easy to use and setup. It is equipped with an intuitive, graphical user interface for controlling the tool settings and image-processing parameters. It also incorporates various features such as automatic zooming and defect review that can enhance the throughput of inspection tasks. Finally, the asset has an automated mask layout function that can operate over multiple mask layers and allow for the easy alignment of masks to wafers. With these advanced features, VI-4302 provides an excellent solution for mask and wafer inspection applications.