Used TOPCON WM 10 #9243645 for sale

TOPCON WM 10 is a mask and wafer inspection equipment designed to enable fast and accurate measurement and defect detection. This system features an advanced silicon metrology unit, which utilizes a high-accuracy nano-positioning stage to allow for precise traversal across the entire wafer or reticle. TOPCON WM-10 utilizes a powerful lens machine to provide an image of the mask and wafer. This includes both brightfield and darkfield imaging modes, which are designed to maximize definition of the wafer and mask, as well as increase defect visibility. Additionally, this tool contains advanced image processing capabilities, which allow for improved visual inspection results and increased accuracy. The asset also features a unique four-channel optical scanner, which uses four lasers, allowing it to scan a wafer in both the X and Y axes. This allows for precise inspection of the wafer and mask with no compromising detail or accuracy. Additionally, the model is equipped with a host of automated tools, which enable users to perform a range of measurements in a fraction of the time. In order to ensure accuracy, WM 10 is also equipped with a range of highly sensitive probes. These probes enable users to accurately measure both the shape and size of the mask and wafer structures, while still maintaining reliable results. WM-10 also features support for multiple data standards, allowing users to transfer data to other systems and perform remote diagnosis or analysis. This equipment has been designed with scalability in mind, meaning that it can be adjusted to meet the specific needs of any inspection application. Overall, TOPCON WM 10 provides users with a powerful, highly precise and efficient mask and wafer inspection system. It's advanced silicon metrology, optical scanning and image processing capabilities make it ideal for use in inspecting semiconductor and display applications. Additionally, its multi-data standard support, scalability and user-friendly design make it a great choice for any inspection task.