Used TOPCON WM 1500 #9053427 for sale

TOPCON WM 1500 is a state-of-the-art mask and wafer inspection equipment designed specifically for advanced semiconductor production. This highly specialized system offers an array of features to maximize productivity and ensure the highest quality image control. WM 1500 is powered by a high-performance optical videomicroscope that incorporates advanced image processing technology. This microscope is designed for demanding optical inspections, such as lithography, on masks and wafers being used in the fabrication of integrated circuits. TOPCON WM 1500 utilizes a variety of advanced imaging and sample analysis technologies to ensure precise, accurate, and repeatable inspection of both defects and features of the semiconductor device. WM 1500 unit also provides a powerful, easily-accessible user interface. This interface allows users to quickly access tools and functions for effective image manipulation and analysis. These user-friendly interface capabilities include a variety of pre-defined inspection techniques, full color calibration, and convenient feature-delineation capabilities. This advanced machine utilizes several precision, motor-driven scanning stages and tilt stages to provide a range of accuracy and speed options. The positioning stages are controlled with high-performance servodrive controls that allow for absolute repeatability in the positioning accuracy. TOPCON WM 1500 is capable of handling 25x and 100x magnification, and the stages in the tool will allow for wafers up to 300mm in diameter. WM 1500 also utilizes automated mapping for quick synchronous scanning of multiple wafers or entire wafer lots. TOPCON WM 1500 asset can support both RGB and monochrome analog CCD cameras. This model is also capable of capturing and manipulating a wide variety of image formats, including TIFF, JPEG, BMP, and PCX. WM 1500 equipment offers a sophisticated suite of software algorithms for advanced defect and feature analysis and defect labeling. These algorithms enable automatic defect detection and classification, true defect detection with quantitative metrics, flexible defect categorization systems, and defect labeling in a variety of convenient formats. In short, TOPCON WM 1500 is an advanced mask and wafer inspection system that provides premium image control and user-friendly software for precise inspection of advanced semiconductor devices. This sophisticated unit is perfect for demanding optical inspections in the fabrication of integrated circuits.