Used TOPCON WM 2500 #293616515 for sale

TOPCON WM 2500 is an advanced mask and wafer inspection equipment designed to detect and identify microscopic defects in semiconductor wafers and masks. The system has a host of features and technologies such as an optically linear array, an advanced binary optics unit, an embedded metrology operation, and an advanced defect analysis machine, which can detect and classify defects even smaller than the size of a single transistor. At the heart of WM 2500 is its optically linear array, which works to capture and store thousands of images with each image composed of thousands of pixels, and each pixel representing up to 256 levels of gray. This tool creates an ultra-high resolution image of the surface of the wafer, mask, or reticle, and works to identify, classify, and quantify any defects that may exist on the surface. TOPCON WM 2500 also employs an embedded metrology operation, which means no external measuring machine is needed to detect and measure defect size. The embedded metrology operation is capable of finding and measuring defects ranging from one micrometer to tens of micrometers in size, and can gather this data for statistical analysis. WM 2500 also utilizes an advanced binary optics asset, which allows for the inspection of different types of defects, such as crystal defects, line breaks, and clear or transparent particles. The model can also inspect large-area surface defects, such as voids and particles, and can capture images of objects at different angles. Lastly, the equipment is capable of employing an advanced defect analysis system, which works to help users identify and classify defects based on a variety of characteristics such as size, brightness, shape, orientation, and edge sharpness. This unit can accurately detect and identify defects even smaller than a single transistor and can provide detailed information about their location and appearance. With its advanced optics, metrology, and defect analysis machine, TOPCON WM 2500 is an invaluable tool for semiconductor companies and is capable of helping them accurately identify, classify, and quantify defects that could threaten the integrity of their products.