Used TOPCON WM 2500 #9266612 for sale

TOPCON WM 2500 is a mask & wafer inspection equipment designed to accurately detect and measure defects in semiconductor wafers and masks. This system is capable of inspecting a variety of wafer sizes (up to 8-inch/200mm) and measuring defects down to 0.33 Microns. The optics feature a 4X telecentric lens that allows for a wide 90mm field of view with no magnification variation. The illumination unit uses LED light sources that provide an even, homogenous pattern with low power consumption and no risk of damage to the wafers. WM 2500 incorporates a color CCD image sensor and advanced digital image processing algorithms to detect and measure defects. The machine utilizes a brightfield imaging mode with Defect Detection Mode (DDM) and Continuous Defect Enhancement Mode (CDEM) capabilities. DDM uses pattern matching and contrast enhancement to detect various types of defects, such as flaws, particles, scratches, pinholes, and missing or misplaced masks. It can detect defects up to 0.33 microns in size within the patterned area. CDEM scans the entirety of the wafer and is used to detect yieldspot defects, or defects too small to be visualized with brightfield imaging. The image processor additionally supports wafer grid inspection and mark inspection. TOPCON WM 2500 features a Novastar HPI High-speed pattern inspection tool to analyze a wide variety of shapes and feature sizes. This includes critical dimensions, tilt, and placement of structures down to 0.1 Microns in size. The asset also includes auto-focus and auto-centering capabilities. This real-time optimization allows for accurate inspection and measurement even if the wafers are shifted from their original positions. Furthermore, the model includes full data storage and reporting capabilities. Images of inspected wafers can be stored as well as reports generated in .csv and other formats. The equipment is capable of communication via various interfaces, including Ethernet, USB, and serial ports, which allows for remote data access and the ability to integrate with an external computer-controlled system. Additionally, WM 2500 is compliant with SEMI standards. All in all, TOPCON WM 2500 is a reliable, user-friendly mask & wafer inspection unit designed for fast and accurate defect inspection and measurement. Its telecentric optics, advanced image processing algorithms, Novastar HPI inspection machine, and extensive data storage and reporting capabilities make it ideal for semiconductor manufacturing and testing applications.