Used TOPCON WM 3 #9250106 for sale

TOPCON WM 3 is a mask and wafer inspection equipment which utilizes advanced image processing technologies to detect defects in fabricated masks and wafers. It has an integrated 4-view optical inspection system with genuine RGB illumination. To achieve higher accuracy in defect detection, the unit employs advanced pattern-matching algorithms, permitting simultaneous inspection of different masks or wafers. The machine achieves superior image acquisition capabilities based on high-resolution camera optics. It also features integrated hardware- and software-based anti-reflection and flare reduction techniques, ensuring clear and sharp images of the inspected mask and wafer. The tool's digital cameras feature a combination of high resolution Bayer and RGB monochrome patterns. The defect detection capabilities of TOPCON WM-3 asset are excellent, as it can detect and accurately classify both small and medium size defects. The model can automatically detect defects up to sub-micron sizes with its advanced pattern matching algorithms. Furthermore, it can detect other irregularities such as surface non-uniformity. The equipment can also detect various kinds of defects such as particles, scratches, stains, delamination or contamination. WM 3 system is capable of measuring and analyzing various defects and the relative position between Wafer defects and masks. The unit includes a high-speed data-processing machine which can rapidly process multiple images. The collected data is then exported to external systems for further processing. A powerful API is also provided which allows integration of the tool with other machines or processes. WM-3 asset is versatile, as it offers the user various different ways to customize and tailor the model to their needs. It also features user-friendly graphical user interfaces and powerful automation equipment which makes the system easy to use and configure. Overall, TOPCON WM 3 unit is an extremely powerful and versatile tool for mask and wafer inspection. It offers excellent defect detection capabilities, high-speed data processing systems and customizable user interfaces which make it perfect for a wide range of inspection and analysis tasks.